Microstructure kuongororwa uye kuongororwa kwezvinhu zvesemiconductor
Nhanganyaya Yebasa
Nekuenderera mberi kwekuvandudzwa kwemasekete makuru akabatanidzwa, iyo chip yekugadzira maitiro iri kuramba ichiwedzera kuoma, uye iyo isina kujairika microstructure uye kuumbwa kwezvinhu zvesemiconductor zvinokanganisa kuvandudzwa kwegoho rechip, izvo zvinounza matambudziko makuru pakuitwa kwe semiconductor nyowani uye yakabatanidzwa. michina yedunhu.
GRGTEST inopa yakazara semiconductor zvinhu microstructure kuongororwa uye kuongororwa kubatsira vatengi kuvandudza semiconductor uye yakabatanidzwa yedunhu maitirwo, kusanganisira gadziriro yewafer level profile uye yemagetsi kuongororwa, kuongororwa kwakadzama kwemuviri uye makemikari zvimiro zve semiconductor kugadzira zvine chekuita nezvinhu, kugadzira uye kuita semiconductor zvinhu zvinosvibisa ongororo. program.
Service scope
Semiconductor zvinhu, organic diki molecule zvinhu, polymer zvinhu, organic/inorganic hybrid zvinhu, inorganic isiri-simbi zvinhu.
Purogiramu yebasa
1. Chip wafer level profil gadziriro uye kuongororwa kwemagetsi, zvichibva pane yakatarisa ion beam tekinoroji (DB-FIB), kunyatsocheka kwenzvimbo yenzvimbo yechip, uye chaiyo-nguva yemagetsi imaging, inogona kuwana iyo chip profile chimiro, kuumbwa uye zvimwe. ruzivo rwakakosha rwemaitiro;
2. Kuongorora kwakadzama kwechimiro chemuviri nemakemikari ezvigadzirwa zvekugadzira semiconductor, zvinosanganisira organic polymer zvinhu, diki mamorekuru zvinhu, inorganic isiri-metallic materials composition analysis, molecular structure analysis, nezvimwewo;
3. Kugadzira uye kushandiswa kwekusvibisa chirongwa chekuongorora che semiconductor zvinhu.Inogona kubatsira vatengi kunyatsonzwisisa chimiro chemuviri uye chemakemikari ezvinosvibisa, zvinosanganisira: makemikari kuumbwa kwekuongorora, chikamu chemukati chekuongorora, mamorekuru chimiro chekuongorora uye kumwe kuongorora kwemuviri nemakemikari maitiro.
Zvinhu Zvebasa
| Servicetype | Servicezvinhu |
| Elemental composition analysis of semiconductor materials | l EDS yekutanga ongororo, l X-ray photoelectron spectroscopy (XPS) yekutanga kuongorora |
| Molecular structure analysis of semiconductor materials | l FT-IR infrared spectrum analysis, l X-ray diffraction (XRD) spectroscopic analysis, l Nuclear magnetic resonance pop Analysis (H1NMR, C13NMR) |
| Microstructure kuongororwa kwezvinhu zvesemiconductor | l Kaviri yakatarisa ion danda (DBFIB) chidimbu chekuongorora, l Munda emission scanning electron microscopy (FESEM) yakashandiswa kuyera nekucherechedza microscopic morphology, l Atomic force microscopy (AFM) yekutarisa morphology yepasi |
